Journal Title：Micron

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.

Micron 是一个跨学科论坛，适用于所有涉及显微镜新应用或高级显微镜发挥核心作用的工作。该期刊将发表关于显微镜和微分析的设计、方法、应用、实践或理论的文章，​​包括关于光学、电子束、X 射线显微断层扫描和扫描探针系统的报告。它还旨在定期发表评论论文、简短的交流以及关于显微镜和微分析当代发展的主题问题。该杂志包含原创性研究，其中显微镜对生物学、生命科学、纳米科学和纳米技术、材料科学和工程的知识做出了重大贡献。